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  • Low voltage EELS - How low?

    Publication
    Ultramicroscopy
    Stöger-Pollach, M.

    Using low beam energies in a (scanning) transmission electron microscope (S/TEM) has numerous advantages over higher beam energies. We discuss the performance of commonly available electron microscopes when being operated at reduced beam energies.

  • Advanced synthesis of materials for intermediate-temperature solid oxide fuel cells

    Publication
    Progress in Materials Science
    Shao, Z.

    Solid-oxide fuel cells (SOFCs) technology has a substantial potential in the application of clean and efficient electric power generation.

  • Imaging and quantifying the morphology of an organic–inorganic nanoparticle at the sub-nanometre level

    Publication
    Nature Nanotechnology
    van Schooneveld, M. M.; Gloter, A.; Stephan, O.; Zagonel, L. F.; Koole, R.; Meijerink, A.; Mulder W. J. M.; de Groot, F. M. F.

    The development of hybrid organic–inorganic nanoparticles is of interest for applications such as drug delivery, DNA and protein recognition, and medical diagnostics.

  • Mineralogy and petrology of comet 81P/wild 2 nucleus samples

    Publication
    Science
    Zolensky, M. E.; Zega, T. J.; Yano, H.; Wirick, S.; Westphal, A. J.; Weisberg, M. K.; Weber, I.; Warren, J. L.; Velbel, M. A.; Tsuchiyama, A.; Tsou, P.; Toppani, A.; Tomioka, N.; Tomeoka, K.; Teslich, K.; Taheri, M.; Susini, J.; Stroud, R.; Stephan, T.; Stadermann, F. J.; Snead, C. J.; Simon, S. B.; Simionovici, A.; See, T. H.; Robert, F.; Rietmeijer, F. J. M.; Rao, W.; Perronnet, M. C.; Papanastassiou, D. A.; Okudaira, K.; Ohsumi, K.; Ohnishi, I.; Nakamura-Messenger, K.; Nakamura, T.; Mostefaoui, S.; Mikouchi, T.; Meibom, A.; Matrajt, G.; Marcus, M. A.; Leroux, H.; Lemelle, L.; Le, L.; Lanzirotti, A.; Langenhorst, F.; Krot, A. N.; Keller, L. P.; Kearsley, A. T.; Joswiak, D.; Jacob, D.; Ishii, H.; Harvey, R.; Hagiya, K.; Grossman, L.; Grossman, J. N.; Graham, G. A.; Gounelle, M.; Gillet, P.; Genge, M. J.; Flynn, G.; Ferroir, T.; Fallon, S.; Ebel, D. S.; Dai, Z. D.; Cordier, P.; Clark, B.; Chi, M.; Butterworth, A. L.; Brownlee, D. E.; Bridges, J. C.; Brennan, S.; Brearley, A.; Bradley, J. P.; Bleuet, P.; Bland, P. A.; Bastien, R.

    The bulk of the comet 81P/Wild 2 (hereafter Wild 2) samples returned to Earth by the Stardust spacecraft appear to be weakly constructed mixtures of nanometer-scale grains, with occasional much larger (over 1 micrometer) ferromagnesian silicates, Fe-Ni sulfides, Fe-Ni metal, and accessory phases.

  • Subparticle ultrafast spectrum imaging in 4D electron microscopy

    Publication
    Science
    Yurtsever, A.; van der Veen, R. M.; Zewail, A. H.

    Single-particle imaging of structures has become a powerful methodology in nanoscience and molecular and cell biology. We report the development of subparticle imaging with space, time, and energy resolutions of nanometers, femtoseconds, and millielectron volts, respectively.

  • Seeing the atoms more clearly: STEM imaging from the Crewe era to today

    Publication
    Ultramicroscopy
    Pennycook, S. J.

    This review covers the development of scanning transmission electron microscopy from the innovations of Albert Crewe to the two-dimensional spectrum imaging in the era of aberration correction.

  • Gentle STEM: ADF imaging and EELS at low primary energies

    Publication
    Ultramicroscopy
    Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

    Aberration correction of the scanning transmission electron microscope (STEM) has made it possible to reach probe sizes close to 1 Å at 60 keV, an operating energy that avoids direct knock-on damage in materials consisting of light atoms such as B, C, N and O.

  • Atom-by-atom spectroscopy at graphene edge

    Publication
    Nature
    Suenaga, K.; Koshino, M.

    The properties of many nanoscale devices are sensitive to local atomic configurations, and so elemental identification and electronic state analysis at the scale of individual atoms is becoming increasingly important.

  • Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscope

    Publication
    Micron
    Yakovlev, S.; Libera, M.

    Spectroscopic imaging in the scanning transmission electron microscope (STEM) using spatially resolved electron energy-loss spectroscopy (EELS) provides one of the few ways to quantitatively measure the real-space nanoscale morphology of soft materials such as polymers and biological tissue.

  • Arsenic dopant mapping in state-of-the-art semiconductor devices using electron energy-loss spectroscopy

    Publication
    Micron
    Servanton, G.; Pantel, R.

    Knowledge of the dopant distribution in nanodevices is critical for optimising their electrical performances.

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