Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

Advances in electron-based instrumentation have enabled the acquisition of multidimensional data sets for exploring the unique structure-property relationship of nanomaterials. In this manuscript, we report a technique for directly probing and analyzing the three-dimensional (3D) electronic structure of a material at the nano-scale. This technique, referred to here as 4D STEM-EELS, utilizes a rotation holder and pillar-shaped samples to allow STEM mode high-angle annular dark-field (HAADF) and EELS spectrum images to be recorded over a complete 180 degrees rotation to minimize artifacts.

Published in


Authored by

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Publication date

Sunday, March 1, 2009
Resource category
Technique category