Gentle STEM: ADF imaging and EELS at low primary energies

Aberration correction of the scanning transmission electron microscope (STEM) has made it possible to reach probe sizes close to 1 Å at 60 keV, an operating energy that avoids direct knock-on damage in materials consisting of light atoms such as B, C, N and O. Although greatly reduced, some radiation damage is still present at this energy, and this limits the maximum usable electron dose. Elemental analysis by electron energy loss spectroscopy (EELS) is then usefully supplemented by annular dark field (ADF) imaging, for which the signal is larger.

Published in


Authored by

Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

Publication date

Thursday, July 1, 2010
Resource category
Technique category