Nanoscale voxel spectroscopy by simultaneous EELS and EDS tomography

Extending the capabilities of electron tomography with advanced imaging techniques and novel data processing methods, can augment the information content in three-dimensional (3D) reconstructions from projections taken in the transmission electron microscope (TEM). In this work we present the application of simultaneous electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDS) to scanning TEM tomography.

Published in


Authored by

Haberfehlner, G.; Orthacker, A.; Albu, M.; Li, J.; Kothleitner, G.

Publication date

Tuesday, October 21, 2014
Resource category
Technique category