Review of recent advances in spectrum imaging and its extension to reciprocal space

Using examples from various domains of science, this review covers some recent developments in spectrum imaging (SI) using scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). Advanced multi dimensional acquisition methods allow the acquisition of STEM–EELS data with other complementary data such as energy dispersive X-ray spectroscopy (EDS), cathodoluminescence and even combining them with reciprocal space analysis through a new method called diffraction imaging.

Published in

Japan Society of Microscopy

Authored by

Maigne, A.; Twesten, R. D.

Publication date

Monday, April 27, 2009
Resource category
Technique category