Resources

Showing 11-20 of 27

Fast atomic DualEELS color map across the SrTiO3/SrMnO4 interface

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Professor David J. Smith at Arizona State University, Tempe, AZ Microscope courtesy of Professor Ray Carpenter at Arizona State University, Tempe, AZ Acknowledgement to Dr. Toshiro Aoki at Jeol USA (now at ASU) for helping set up microscope for experiment.

Legend

Red: Ti L at 456 eV; green: Sr L at 1940 eV; yellow: La M at 832 eV; blue: Mn L at 640 eV

Methods
Fast DualEELS color map across the InP/HfO2 interface

Media Image

Paolo Longo PhD, Gatan, Inc. Sample courtesy of Professor Robert Wallace at UTD, Richardson, TX Microscope courtesy of Professor Ray Carpenter, Arizona State University, Tempe AZ Acknowledgement to Dr. Toshiro Aoki at Jeol USA (now at ASU) for helping set up microscope for experiment.

InP substrate is very beam sensitive; EELS analysis was carried out at high-speed to avoid electron beam-induced damage.

Methods

Probe-corrected Jeol ARM 200 TEM/STEM microscope; S-FEG emission gun; Enfinium™ ER system; voltage: 200 kV; STEM mode
Ultrafast giant atomic EELS color map across the SrTiO3/LaMnO4 interfaces

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Acknowledgement to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden) for helping set up microscope for experiment.

Legend

Green: Ti L at 456 eV; red: Sr L at 1940 eV; purple: La M at 832 eV; blue: Mn L at 640 eV

Methods
Fast joint EELS/EDS color map across SrTiO3/LaFeO3/LaCuOx interfaces

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of by Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.

Methods
Fast joint EELS / EDS color map across the SrTiO3/LaFeO3 interfaces

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.

Methods
Fast joint EELS / EDS color map across a 32 nm transistor device

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Pavel Potapov at Global Foundries, Dresden, Germany Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.

Methods
Fast Joint EELS / EDS color map of a SrTiO3 crystal

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Yan Xin at Florida State University, Tallahassee, FL Microscope courtesy of Professor Gerald Kothleitner, TU-Graz, Austria Acknowledgement to Dr. Arno Meingast at CCEM, TU-Graz, Austria for helping set up microscope for experiment.

Methods
Fast atomic EELS analysis across the GaN/AlGaN interface

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Methods
First atomic EELS map acquired during volcano eruption

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Microscope courtesy of Dr. Giuseppe Nicotra, IMM-CNR, Catania, Italy

The lab where EELS maps were taken is situated at the slopes of Mount Etna in Sicily, Italy. Mount Etna is the highest active volcano in Europe. The EELS elemental maps were taken at high speed during major volcano eruption, as shown in the volcano webcam photograph above the maps.
Atomic DualEELS analysis of CaFeO2,5 Brownmillerite structure—Investigating the presence of oxygen vacancies

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Professor Ramachandra Rao at Indian Institute of Technology, Chennai Madras, India Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Fe-O atoms are arranged in alternating tetrahedral and octahedral planes that can be distinguished looking at the fine structure of the O K-edge at 532 eV.