Publication
Mukai, M.; Okunishi, E.; Ashino, M.; Omoto, K.; Fukuda, T.; Ikeda, A.; Somehara, K.; Kaneyama, T.; Saitoh, T.; Hirayama, T.; Ikuhara, Y.
In this article, we report the development of a new 200-kV analytical electron microscope equipped with a monochromator with an integrated double Wien-filter system.