The multiple linear least squares (MLLS) fitting routine provides a very useful means for mapping difference spectra phases or features by reference to their spectral signature. . . .
Downloadable *.pdf of the application note.
Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. . . .
Metals such Pd and Pt have been extensively used in the automotive industry as exhaust gas catalyst for pollution control. . . .
Electron energy loss spectroscopy (EELS) is the analysis of the energy distribution of the electrons that have passed through a thin sample and have interacted with it inelastically. . . .
As the size of III-V devices decreases, ohmic contacts and their performance becomes increasingly significant. . . .
Over the past few years, with the advancements in aberration-corrected transmission electron microscopy, the spatial resolution in scanning transmission electron microscopy (STEM) has been enormously improved. . . .
Step by step instructions on how to prepare a gain reference.
In an age of atomic-scale control of materials and interfaces, the need for high spatial resolution characterization and local bonding is accelerating.
We report a simple method for measuring the inelastic mean free path of nanostructures of known geometry using energy filtered transmission electron microscopy imaging.