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Nanoscale analysis of polymer interfaces by energy-filtering transmission electron microscopy

Publication

Macromolecular Chemistry and Physics

Horiuchi, S.; Yin, D.; Ougizawa, T.

Energy-filtering transmission electron microscopy (EFTEM) was employed for the analysis of polymer-polymer interfaces. To attain imaging and spectral analyses with a spatial resolution of 10 nm, problems arising in the EFTEM analysis for polymer specimens were investigated.
EELS analysis of metal segregation across grain boundary in Yttria-stabilized Zirconia (YSZ) – investigating oxygen vacancies

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Paolo Longo, Ph.D., Gatan, Inc. Microscope and sample courtesy of Dr. Maria Varela at Oak Ridge National Lab, Oak Ridge, TN

EELS data were acquired using a probe-corrected NION Ultrastem 200 TEM/STEM microscope equipped with C-FEG emission gun and a fully loaded Enfinium™ ER system.

Methods
Fast EELS analysis of AlNiCo based metal alloy for magnetic purposes

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Li Zhou at Ames Lab, Iowa

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system.

Methods

Voltage: 200 kV; data taken in STEM mode; EELS spectrum (300 – 2300 eV) exposure time: 8 ms; total exposure time:
Fast EELS analysis of metals in a blood cell attacked by the malaria parasite

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Paolo Longo, Ph.D., Gatan, Inc.

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system.

Methods
Fast DualEELS analysis of the distribution of Pd particles and their chemistry in zeolite

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Paolo Longo, Ph.D., Gatan, Inc.

The EELS analysis shows how Pd particles chemically interact with support.
Atomic DualEELS analysis of CaFeO2,5 Brownmillerite structure—Investigating the presence of oxygen vacancies

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Professor Ramachandra Rao at Indian Institute of Technology, Chennai Madras, India Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Fe-O atoms are arranged in alternating tetrahedral and octahedral planes that can be distinguished looking at the fine structure of the O K-edge at 532 eV.
First atomic EELS map acquired during volcano eruption

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Microscope courtesy of Dr. Giuseppe Nicotra, IMM-CNR, Catania, Italy

The lab where EELS maps were taken is situated at the slopes of Mount Etna in Sicily, Italy. Mount Etna is the highest active volcano in Europe. The EELS elemental maps were taken at high speed during major volcano eruption, as shown in the volcano webcam photograph above the maps.
Fast atomic EELS analysis across the GaN/AlGaN interface

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Methods
Fast Joint EELS / EDS color map of a SrTiO3 crystal

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Yan Xin at Florida State University, Tallahassee, FL Microscope courtesy of Professor Gerald Kothleitner, TU-Graz, Austria Acknowledgement to Dr. Arno Meingast at CCEM, TU-Graz, Austria for helping set up microscope for experiment.

Methods
Fast joint EELS / EDS color map across a 32 nm transistor device

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Pavel Potapov at Global Foundries, Dresden, Germany Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.

Methods