| Major Edges | ||
|---|---|---|
| K | 1560 | |
| L23 | 73 | |
| Minor Edges | ||
|---|---|---|
| L1 | 118 | |
Considerations
The L-edge of Al shows strong variation in ELNES especially for minerals. Its low energy often makes edge extraction problematic. A 1st order log-polynomial is often the best background model. Thin specimen (<0.5 mfp) and/or plural scattering deconvolution is often useful.
The K-edge of Al is better suited for compositions mapping and quantification, but often lies near the stay emission artifact Schottky emitters. Be sure the collection angle is sufficient.
The plasmon peak of Al metal is very sharp and its energy can be measured with high precision. Changes in local temperature and alloying have been be detected and quantified via the energy shift.
Al polycrystalline film_0-0450eV
- Material Analyzed:Al
- Related Elements:Aluminum
- Data Contributor:Gatan
- Beam energy (keV):200
- Nominal energy range (eV):0 - 150
- Collection semi-angle effective (mrad):100
- Notes:
Serial EELS; slightly oxidized; zero-loss peak intensity = 8.19e8; total elastic int. / zero-loss int. = 0.17; gain change = 522; 25 sweeps 20 ms dwell
Al2O3 thin film_0-0450eV
- Material Analyzed:Al2O3
- Related Elements:Aluminum, Oxygen
- Data Contributor:Gatan
- Beam energy (keV):200
- Nominal energy range (eV):0 - 450
- Collection semi-angle effective (mrad):100
- Notes:
Serial EELS; zero-loss peak intensity = 7.84e8; total elastic int. / zero-loss int. = 0.18; gain change factor = 654; 20 sweeps 20 ms dwell
