Major Edges | ||
---|---|---|
L3 | 5723 | |
M4 | 901 | |
M5 | 883 | |
N45 | 110 | |
O23 | 20 |
Minor Edges | ||
---|---|---|
L1 | 6549 | |
L2 | 6164 | |
M1 | 1435 | |
M2 | 1273 | |
M3 | 1185 | |
N1 | 290 | |
N2 | 233 | |
N3 | 207 | |
O1 | 38 |
Considerations
Sharp M4,5-edges allow for trace analysis.
CeO2 thin film_0-0380eV
- Material Analyzed:CeO2
- Related Elements:Cerium, Oxygen
- Data Contributor:Gatan
- Beam energy (keV):200
- Nominal energy range (eV):0 - 380
- Collection semi-angle effective (mrad):100
- Notes:
Serial EELS; zero-loss peak intensity = 1.27e9; total elastic int. / zero-loss int. = 0.25; gain change factor = 874; contamination; 20 sweeps 20 ms dwell