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58 CeCerium140.116

Cerium

Element Density: 6.689 g/cm3
Electron Configuration:
[Xe]4f15d16s2
Oxidation States: +3,4
Major Edges
L35723
M4901
M5883
N45110
O2320
Minor Edges
L16549
L26164
M11435
M21273
M31185
N1290
N2233
N3207
O138

Considerations

Sharp M4,5-edges allow for trace analysis.

CeO2 thin film_0-0080eV

  • Material Analyzed:
    CeO2
  • Related Elements:Cerium, Oxygen
  • Data Contributor:Gatan
  • Beam energy (keV):200
  • Nominal energy range (eV):0 - 180
  • 0
  • Notes:

    Serial EELS; 13 sweeps 20 ms dwell

CeO2 thin film_0-0380eV

  • Material Analyzed:
    CeO2
  • Related Elements:Cerium, Oxygen
  • Data Contributor:Gatan
  • Beam energy (keV):200
  • Nominal energy range (eV):0 - 380
  • Collection semi-angle effective (mrad):100
  • Notes:

    Serial EELS; zero-loss peak intensity = 1.27e9; total elastic int. / zero-loss int. = 0.25; gain change factor = 874; contamination; 20 sweeps 20 ms dwell

CeO2 thin film_0-0950eV

  • Material Analyzed:
    CeO2
  • Related Elements:Cerium, Oxygen
  • Data Contributor:Gatan
  • Beam energy (keV):200
  • Nominal energy range (eV):0 - 950
  • Collection semi-angle effective (mrad):100
  • Notes:

    Serial EELS; 45 sweeps 20 ms dwell

CeO2 thin film_0350-1360eV

  • Material Analyzed:
    CeO2
  • Related Elements:Cerium, Oxygen
  • Data Contributor:Gatan
  • Beam energy (keV):200
  • Nominal energy range (eV):350 - 1360
  • Collection semi-angle effective (mrad):100
  • Notes:

    Serial EELS; 20 sweeps 30ms dwell