Major Edges | ||
---|---|---|
K | 8333 | |
L2 | 872 | |
L3 | 855 | |
M23 | 68 |
Minor Edges | ||
---|---|---|
L1 | 1008 | |
M1 | 112 |
Considerations
Rich ELNES structure in L2,3-edges. White line ratio and energy shift used to determine oxidation state.
NiO thin film_0-0960eV
- Material Analyzed:NiO
- Related Elements:Nickel, Oxygen
- Data Contributor:Gatan
- Beam energy (keV):200
- Nominal energy range (eV):0 - 960
- Collection semi-angle effective (mrad):100
- Notes:
Serial EELS; zero-loss peak intensity = 7.50e9; total elastic int. / zero-loss int. = 0.47; gain change factor = 1073; 220 sweeps 20 ms dwell