EELS analysis of metal segregation across grain boundary in Yttria-stabilized Zirconia (YSZ) – investigating oxygen vacancies

EELS data were acquired using a probe-corrected NION Ultrastem 200 TEM/STEM microscope equipped with C-FEG emission gun and a fully loaded Enfinium™ ER system.

Methods

Voltage: 200 kV; data taken in STEM mode; EELS core-loss spectrum (400 – 2400 eV): 40 ms; dataset size: 128 x 128 pixels