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Colorized EELS elemental map

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This work was performed in collaboration with Dr. Phil Rice and Dr. Teya Topuria of IBM Almaden Research Center in San Jose, CA who provided expert assistance as well as the TEM specimen and access to their microscope facilities.

Colorized EELS elemental map of Ti L2,3-edges at 456 eV (green), Mn L2,3-edges at 640 eV (blue), La M4,5-edges at 832 eV (purple) and Sr L2,3-edges at 1940 eV (red).
Jointly acquired HAADF and MAADF signals

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The HAADF signal (left) contrast is easily interpreted in terms of mass thickness of the material while the diffraction contrast MAADF signal (right) reveals highly detailed structural changes in the material. The optimized geometry makes this possible.
Phosphorus-containing macromolecular assemblies in the cell nuclei of drosophila larvae

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Data courtesy of Dr. Maria Aronova and Dr. Richard Leapman, National Institutes of Health, Bethesda, Maryland.

Image of phosphorus-containing macromolecular assemblies in the cell nuclei of drosophila larvae; dual-axis EFTEM tilt series acquired with a Tridiem energy filter from -66˚ to 66˚; for each axis phosphorus L-23 series (20 eV slit, pre-edge and post-edge) were collected; a jump-ratio series was c
EELS analysis of metal segregation across grain boundary in Yttria-stabilized Zirconia (YSZ) – investigating oxygen vacancies

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Paolo Longo, Ph.D., Gatan, Inc. Microscope and sample courtesy of Dr. Maria Varela at Oak Ridge National Lab, Oak Ridge, TN

EELS data were acquired using a probe-corrected NION Ultrastem 200 TEM/STEM microscope equipped with C-FEG emission gun and a fully loaded Enfinium™ ER system.

Methods
Fast EELS analysis of AlNiCo based metal alloy for magnetic purposes

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Li Zhou at Ames Lab, Iowa

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system.

Methods

Voltage: 200 kV; data taken in STEM mode; EELS spectrum (300 – 2300 eV) exposure time: 8 ms; total exposure time:
Fast EELS analysis of metals in a blood cell attacked by the malaria parasite

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Paolo Longo, Ph.D., Gatan, Inc.

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system.

Methods
Fast DualEELS analysis of the distribution of Pd particles and their chemistry in zeolite

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Paolo Longo, Ph.D., Gatan, Inc.

The EELS analysis shows how Pd particles chemically interact with support.
Atomic DualEELS analysis of CaFeO2,5 Brownmillerite structure—Investigating the presence of oxygen vacancies

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Professor Ramachandra Rao at Indian Institute of Technology, Chennai Madras, India Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Fe-O atoms are arranged in alternating tetrahedral and octahedral planes that can be distinguished looking at the fine structure of the O K-edge at 532 eV.
First atomic EELS map acquired during volcano eruption

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA Microscope courtesy of Dr. Giuseppe Nicotra, IMM-CNR, Catania, Italy

The lab where EELS maps were taken is situated at the slopes of Mount Etna in Sicily, Italy. Mount Etna is the highest active volcano in Europe. The EELS elemental maps were taken at high speed during major volcano eruption, as shown in the volcano webcam photograph above the maps.
Fast atomic EELS analysis across the GaN/AlGaN interface

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Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy Microscope courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy

Methods