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Fast joint EELS/EDS color map across SrTiO3/LaFeO3/LaCuOx interfaces

Methods

probe-corrected Jeol ARM 200 TEM/STEM microscope
C-FEG emission gun
GIF Quantum® ER system
Sr L at 1940 eV (red); Ti L at 456 eV (green); Fe L at 708 eV (amber); La M at 832 eV (blue); Cu L at 931 eV (purple)
​voltage: 200 kV
data taken in STEM mode
EELS core-loss spectrum (300 – 2300 eV): 5 ms
EDS spectrum (0 – 20 keV): 5 ms

Authored by

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of by Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Microscope courtesy of Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose CA Acknowledgements to Dr. P. Rice and Dr. T. Topuria at IBM (Almaden), San Jose, CA for helping set up microscope for experiment.
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