Resources

Showing 11-13 of 13
  • Fast atomic DualEELS analysis at 60 kV of graphene layers after graphitization process of SiC
    Media Image
    Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Giuseppe Nicotra at IMM-CNR, Catania, Italy Microscope courtesy of IMM-CNR, Catania, Italy

    Methods Probe-corrected ARM 200F TEM/STEM microscope; C-FEG emission gun; GIF Quantum® ER system; voltage: 60 kV; STEM mode; EELS low-loss spectrum (0 – 500 eV) exposure time: 0.01 ms; EELS core-loss spectrum (70 – 570 eV) exposure time: 10 ms; total exposure time:

  • Media Image
    Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Professor Gianluigi Botton at CCEM, Hamilton, ON, Canada Microscope courtesy of CCEM, Hamilton, ON, Canada Acknowledgement to Dr. M. Bugnet at CCEM for helping set up microscope for experiment.

    Pt/Fe nanocatalysts are among the most promising candidates for accelerating oxygen reduction reaction occurring at the cathode in a proton exchange membrane fuel cell.

  • Media Image
    Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Jaco Oliver at NMMU, Port Elizabeth, South Africa Microscope courtesy of NMMU, Port Elizabeth, South Africa

    Analysis of the changes in local carbon structure caused by self-implantation of carbon into diamond and chemistry.

Pages