Resources

Showing 11-20 of 42

Practical approaches for in-situ and environmental transmission electron microscopy

Media Video

Practical approaches for in-situ and environmental transmission electron microscopy
Nanocathodoluminescence reveals the optical properties of III-nitride light emitting diodes

Media Video

Nanocathodoluminescence reveals the optical properties of III-nitride light emitting diodes
Fundamentals of electron energy-loss spectroscopy

Publication

EMAS 2015 Workshop

Hofer, F.; Schmidt, F. P.; Grogger W.; Kothleitner, G.

Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution.
Electron Energy Loss Spectroscopy

Book

Brydson, R.

Electron energy loss spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterize materials.
Energy-Filtering Transmission Electron Microscopy

Book

Reimer, L. (Ed.)

Energy-filtering transmission electron microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy.
Electron Energy Loss Spectroscopy in the Electron Microscope

Book

Egerton, R. F.

Within the last 30 years, electron energy loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
Chemical and compositional analysis of 3D NAND and FinFET devices

Media Video

Learn how the complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials.
STEM alignment for EELS analysis

Media Video

Electron energy loss spectroscopy (EELS) tutorial for STEM alignment.
The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level

Methods

The multiple linear least squares (MLLS) fitting routine provides a very useful means for mapping difference spectra phases or features by reference to their spectral signature. . . .
Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite software

Methods

Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. . . .

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