Resources

Energy-filtering transmission electron microscopy (EFTEM) was employed for the analysis of polymer-polymer interfaces. To attain imaging and spectral analyses with a spatial resolution of 10 nm, problems arising in the EFTEM analysis for polymer specimens were investigated.

Shock recovery experiments have been conducted to assess the role of shock stress and orientation dependence on substructure evolution and deformation twinning of a [1 0 0]/ copper bicrystal.

An electron diffraction technique called D-STEM has been developed in a transmission electron microscopy/scanning transmission electron microscopy (TEM/STEM) instrument to obtain spot electron diffraction patterns from nanostructures, as small as ∼3 nm.

We report initial findings on improvements to precession electron diffraction (PED) achieved through aberration correction of the probe-forming lens and by energy-filtering.