Paolo Longo, Ph.D., Gatan, Inc.
Sample courtesy of Professor Gianluigi Botton at CCEM, Hamilton, ON, Canada
Microscope courtesy of CCEM, Hamilton, ON, Canada
Acknowledgement to Dr. Andreas Korinek at CCEM for helping set up microscope for experiment.
EELS data taken using a probe and image-corrected FEI Titan TEM/STEM microscope equipped with X-FEG emission gun and a fully loaded GIF Quantum® ERS system. Au M4,5-edges at 2206 eV (red) and Pt M4,5-edges at 2206 eV (red).