Resources

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Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum system

Methods

Metals such Pd and Pt have been extensively used in the automotive industry as exhaust gas catalyst for pollution control. . . .
EELS: A tool for investigating biological materials

Methods

Electron energy loss spectroscopy (EELS) is the analysis of the energy distribution of the electrons that have passed through a thin sample and have interacted with it inelastically. . . .
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices

Methods

As the size of III-V devices decreases, ohmic contacts and their performance becomes increasingly significant. . . .
Atomic level EELS mapping using high energy edges in DualEELS mode

Methods

Over the past few years, with the advancements in aberration-corrected transmission electron microscopy, the spatial resolution in scanning transmission electron microscopy (STEM) has been enormously improved. . . .
Prepare a gain reference

Methods

Step by step instructions on how to prepare a gain reference.
Study of inelastic mean free path of metal nanostructures using energy filtered transmission electron microscopy imaging

Publication

Journal of Microscopy

Ghosh, T.; Bardhan, M.; Bhattacharya, M.; Satpati, B.

We report a simple method for measuring the inelastic mean free path of nanostructures of known geometry using energy filtered transmission electron microscopy imaging.
Quantification of ordering at a solid-liquid interface using plasmon electron energy loss spectroscopy

Publication

Applied Physics Letters

Gandman, M.; Kauffmann, Y.; Kaplan, W. D.

Quantification of ordering at a solid-liquid interface using plasmon electron energy loss spectroscopy
Colorized EELS elemental map

Media Image

This work was performed in collaboration with Dr. Phil Rice and Dr. Teya Topuria of IBM Almaden Research Center in San Jose, CA who provided expert assistance as well as the TEM specimen and access to their microscope facilities.

Colorized EELS elemental map of Ti L2,3-edges at 456 eV (green), Mn L2,3-edges at 640 eV (blue), La M4,5-edges at 832 eV (purple) and Sr L2,3-edges at 1940 eV (red).
Jointly acquired HAADF and MAADF signals

Media Image

The HAADF signal (left) contrast is easily interpreted in terms of mass thickness of the material while the diffraction contrast MAADF signal (right) reveals highly detailed structural changes in the material. The optimized geometry makes this possible.
Fast EELS analysis of AlNiCo based metal alloy for magnetic purposes

Media Image

Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Li Zhou at Ames Lab, Iowa

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system. Methods Voltage: 200 kV; data taken in STEM mode; EELS spectrum (300 – 2300 eV) exposure time: 8 ms; total exposure time:

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