EFTEM SI Workflow
The preparation steps for EFTEM spectrum imaging (SI) are almost identical to EFTEM mapping.
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Always start with a well-prepared sample.
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Align the TEM; gun tilt, condenser, and optical axis alignment are critical.
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For mapping, a high beam current is desirable.
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Set the TEM objective lens current at its optimal value.
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Adjust the sample height to achieve coarse focus.
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Center an appropriate objective aperture to limit chromatic blurring.
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Operate TEM in EFTEM or Gatan imaging filter (GIF) lens mode to ensure a stable projector lens crossover.
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Align the ZLP and focus the spectrometer.
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Focus and carefully stigmate the image while observing the image on the GIF camera.
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Offset the energy to obtain incoherent imaging conditions (typically 400 eV offset and 50 eV slit).
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Optimize illumination intensity.
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Carefully refocus incoherent images at energy loss.
You are now ready to set your mapping preferences for EFTEM spectrum imaging acquisition.